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法国CEA研究所透射电子显微术研究博士后岗位

日期:2007-09-26

Institution

CEA Grenoble (http://www.minatec.com/)

Position

Postdoctoral position in transmission electron microscopy of nanostructures

Location

Grenoble, France

Date Posted

Sep 24 2007

Description

The nanocharacterization group at Minatec Innovation Center, CEA-Grenoble, has an opening for a two year post-doctoral position in electron microscopy.

The candidate will be in charge to develop TEM characterization techniques (high resolution STEM, energy filtered imaging, FIB sample preparation) to study novel semiconductor devices, notably 3D nanowire networks integrated in CMOS devices.

We are looking for a candidate skilled in the operation of the TEM, preferably with an experience of specimen preparation using the FIB and a background knowledge of microelectronics. Good communication skills are also required as the candidate is expected to work within a team dedicated to semiconductor characterisation and in close collaboration with the team designing the new devices.

Our laboratory, situated in the French Alps offer a fantastic quality of life combined with excellent research facilities and competitive rates of pay.

Contact

Francois Bertin – CEA Leti / SCPIO
17 rue des Martyrs, 38054 Grenoble, France
E-mail: francois.bertin@cea.fr
Tel : +33 (0)4 38 78 58 49

[作者:jurgen    编辑:]